IEEE MetroAeroSpace 2020
The conference is now closed.
Since the first edition, MetroAeroSpace represents an international meeting place in the world of research in the field of metrology for aerospace involving national and international institutions and academia in a discussion on the state-of-the-art concerning issues that require a joint approach by experts of measurement instrumentation and industrial testing, typically professional engineers, and experts in innovation metrology, typically academics. This 7th edition will keep pursuing the state of the art and practice started over the past years. Attention is paid, but not limited to, new technology for metrology-assisted production in aerospace industry, aircraft component measurement, sensors and associated signal conditioning for aerospace, and calibration methods for electronic test and measurement for aerospace. The program is designed to raise the interest of a wide group of researchers, operators and decision-makers from metrology and aerospace fields, by presenting the most innovative solutions in this field from the scientific and technological point of view. All accepted papers are expected to be included in IEEE Xplore and indexed by EI.